Correlation Spectroscopy of Surfaces, Thin Films, and Nanostructures - Book Review,
by Jamal Berakdar (Editor)

From Book News, Inc. Sixteen papers from a conference on Coincidence Studies of Surfaces, Thin Films and Nanostructures, held in November 2003 at the Ringberg Castle in Germany, provide an overview of current experimental and theoretical methods for studying electronic correlations on surfaces, in thin films, and in nanostructures, including implementation of the mean-field theory and the so-called GW method as well as calculations based on many-body perturbation theory and the embedded-cluster approach. Examples come from atomic, molecular, cluster, surface, and solid-state physics. The contributors are associated with institutions across the globe.Copyright © 2004 Book News, Inc., Portland, OR
Book Description Here, leading scientists present an overview of the most modern experimental and theoretical methods for studying electronic correlations on surfaces, in thin films and in nanostructures. In particular, they describe in detail coincidence techniques for studying many-particle correlations while critically examining the informational content of such processes from a theoretical point viewpoint. Furthermore, the book considers the current state of incorporating many-body effects into theoretical approaches. Covered topics: -Auger-electron photoelectron coincidence experiments and theories -Correlated electron emission from atoms, fullerens, clusters, metals and wide-band gap materials -Ion coincidence spectroscopies and ion scattering theories from surfaces -GW and dynamical mean-field approaches -Many-body effects in electronic and optical response
About the Author A. Marini A. Lahmam-Bennani F. Bell R. A. Bartynski, A. K. See, W.-K. Siu, and S. L. Hulbert R. Feder and H. Gollisch F. Aryasetiawan, S. Biermann and A. Georges O. Kidun, N. Fominykh and J. Berakdar L. Wirtz, M. Dallos, H. Lischka, and J. Burgdörfer K. Mase, E. Kobayashi, K. Isari M. Ohno S. Samarin, O. M. Artamonov, A. D. Sergeant, and J. F. Williams G. Stefani, R. Gotter, A. Ruocco, F. Offi, F. Da Pieve, A. Verdini, A. Liscio, S. Iacobucci, Hua Yao and R. A. Bartynski S. M. Thurgate, Z.-T. Jiang, G. van Riessen and C. Creagh C. Bowles, A. S. Kheifets, V. A. Sashin, M. Vos, E. Weigold, F. Aryasetiawan H. Winter J. Kirschner, C. Winkler and J.Berakdar
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